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Semiconductor Manufacturing Equipment |
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Home - Products -
Test & Instrumentation |
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Characteristics |
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Modular Design |
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Customizable |
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Expandable |
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Easy Integration |
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High Speed and Accuracy |
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Up to 2500V DC |
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Up to 1000A DC |
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Remote Controllable |
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Overview |
The MMCi test system is a modular test equipment for the electrical functional test of semiconductor devices. It provides the speed and accuracy needed for testing ICs and discrete devices (e.g. diodes, transistors, sensors...) in frontend or backend.
The MMCi is designed for the use in interaction with test handlers, wafer probers or at stand-alone test stations.
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High reliability decreasing time and effort for maintenance.
The modularity, customization and reusability offers a wide range of applications by a low invest.
German technology based on longtime experiences in semiconducter testing, engineering and software development. |
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Features |
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Modular design for easy expansion of the system
by MMCi bus up to 128 TMOs |
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Integration to Handler via TTL, GPIB and TCP/IP |
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Test capability for single, continuous and parallel test |
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Connection to other measuring equipment via GPIB
(LCR meter, CV meter, RF test equipment etc.) |
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Remote controllable by TCP/IP |
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Integrated diagnostic tools |
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User friendly GUI for easy operation and flexible
programming |
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Hardware |
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HV-SMU 2500V/30mA |
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Base Control Unit |
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Parallel-Modul 144bit I/O |
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Cooling Modul |
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SMU 300V/10A |
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PreDut Modul 16bit I/O |
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HC-SMU 50V/100A
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Also available:
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DUAL-SMU 160V/150mA |
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HC-SMU 50V/1000A |
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Concept Development:
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DUAL-SMU 160V/150mA |
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Multiport-SMU, ninefold +17V/-5V, 50mA |
Typical test time e.g.
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Dual Diode 15 ms |
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Transistor 25 ms |
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IGBT 60 ms |
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Software |
MMCI (BCU Software)
MMCI is the interface for the user and allows displaying the measurement data, setting up the MMCi, debugging programs and controlling the functionality of the MMCi.
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MMES
MMES is the development system for MMCi measurement program. The program can be created, edited, printed and transferred to the MMCi.
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TUI_MMCi
This software is for setting up and data management of the production lot, generating the datalog and output files, temporary summary for process view, printing the binning summary and creating wafer maps. Barcode scanner will be supported. |
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Contact |
For Sales inquiries or Service requests, please contact us:
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Malaysia
Intotest Sdn Bhd
No. 37 & 39, Jalan IMJ 2,
Taman Perindustrian Malim Jaya,
75250 Melaka,
Malaysia
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Philippines
NexGen Technology Inc
Unit I, 6th Floor, Westgate Tower,
Investment Drive,
Madrigal Business Park,
Alabang, Muntinlupa City 1770, Philippines
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+63 2 490 6904 |
| Fax: |
+63 2 850 2131 |
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| Europe
TCS Oberreuther AG
Hochweg 89
93049 Regensburg
Germany
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+49 941-208230 |
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+49 941-2082320 |
| Email: |
info@tcs.ag |
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